Cluster Secondary Ion Mass Spectrometry
| Autor: | Christine M. Mahoney |
|---|---|
| EAN: | 9781118589250 |
| eBook Format: | |
| Sprache: | Englisch |
| Produktart: | eBook |
| Veröffentlichungsdatum: | 09.04.2013 |
| Untertitel: | Principles and Applications |
| Kategorie: | |
| Schlagworte: | 3D characterization 3D imaging organic materials 3D imaging polymeric materials SIMS SIMS semiconductors cluster ion beams cluster sources organic depth profiling polymer polymeric materials characterization solid materials characterization |
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This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods.
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