Design for Manufacturability and Yield for Nano-Scale CMOS
| Autor: | Charles Chiang, Jamil Kawa |
|---|---|
| EAN: | 9781402051883 |
| eBook Format: | |
| Sprache: | Englisch |
| Produktart: | eBook |
| Veröffentlichungsdatum: | 15.06.2007 |
| Kategorie: | |
| Schlagworte: | CAD (Computer aided design) CAE (Computer aided engineering) CMOS Standard classification computer-aided design (CAD) computer-aided engineering (CAE) design development integrated circuit layout model nano-scale simulation tables |
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This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.
Dr. Charles Chiang is R&D Director of the Advanced Technology Group at Synopsys Inc. in Mountain View, CA, USA
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