Efficient Test Methodologies for High-Speed Serial Links
| Autor: | Hong Dongwoo, Kwang-Ting Cheng |
|---|---|
| EAN: | 9789048134434 |
| eBook Format: | |
| Sprache: | Englisch |
| Produktart: | eBook |
| Veröffentlichungsdatum: | 24.12.2009 |
| Kategorie: | |
| Schlagworte: | BER Estimation Clock and Data Recovery (CDR) Design-for-Test (DFT) Hardware High Speed IO Test Integrated Circuits Interface Jitter Measurement |
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Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.
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