Ellipsometry of Functional Organic Surfaces and Films
| Autor: | Karsten Hinrichs, Klaus-Jochen Eichhorn |
|---|---|
| EAN: | 9783642401282 |
| eBook Format: | |
| Sprache: | Englisch |
| Produktart: | eBook |
| Veröffentlichungsdatum: | 24.10.2013 |
| Kategorie: | |
| Schlagworte: | Biomolecules at Surfaces Characterization of Organic Semiconductors for OPV Ellipsometric Real-time/In-situ Monitoring Techniques Functional and Smart Films Infrared Brillant Light Sources for Micro-ellipsometric Studies Nanostructured Surfaces |
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Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
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