Lock-in Thermography
| Autor: | Breitenstein, Otwin Schubert, Martin C. Warta, Wilhelm |
|---|---|
| EAN: | 9783319998244 |
| Auflage: | 003 |
| Sachgruppe: | Physik, Astronomie Technik |
| Sprache: | Englisch |
| Seitenzahl: | 344 |
| Produktart: | Gebunden |
| Veröffentlichungsdatum: | 22.01.2019 |
| Untertitel: | Basics and Use for Evaluating Electronic Devices and Materials |
| Schlagworte: | Bau / Bautechnik Bautechnik Materialprüfung Mikrowelle (Technik) Nachrichtentechnik Optik Physik |
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This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.
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