Radiation Effects on Embedded Systems
Autor: | Raoul Velazco, Pascal Fouillat, Ricardo Reis |
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EAN: | 9781402056468 |
eBook Format: | |
Sprache: | Englisch |
Produktart: | eBook |
Veröffentlichungsdatum: | 19.06.2007 |
Kategorie: | |
Schlagworte: | Radiation Effects Radiation ground testing Signal analog circuit electronics embedded systems fault tolerance integrated circuit laser microelectronics single-electron transistor single event effects software testing |
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This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.