Reliability, Availability and Serviceability of Networks-on-Chip

Provides state-of-the-art research on the challenges to test, diagnose and tolerate faults in NoC-based systems Includes numerous, current test strategies, including re-use of the network for core testing, test scheduling for the NoC reuse, test access methods and interface, efficient re-use of the network, and power-aware and thermal-aware NoC-based SoC testing Offers a single source reference to the latest research, otherwise available only in disparate journals and conference proceedings Includes supplementary material: sn.pub/extras

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Reliability, Availability and Serviceability of Networks-on-Chip Érika Cota, Alexandre de Morais Amory, Marcelo Soares Lubaszewski

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Reliability, Availability and Serviceability of Networks-on-Chip Cota, Érika, Soares Lubaszewski, Marcelo, De Morais Amory, Alexandre

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Reliability, Availability and Serviceability of Networks-on-Chip Cota, Érika, Soares Lubaszewski, Marcelo, De Morais Amory, Alexandre

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