Scanning Microscopy for Nanotechnology
| Autor: | Weilie Zhou, Zhong-lin Wang |
|---|---|
| EAN: | 9780387396200 |
| eBook Format: | |
| Sprache: | Englisch |
| Produktart: | eBook |
| Veröffentlichungsdatum: | 09.03.2007 |
| Untertitel: | Techniques and Applications |
| Kategorie: | |
| Schlagworte: | Nanotube X-ray carbon nanotubes crystal electron microscopy materials characterization materials engineering microscopy nanomaterial nanoparticle nanostructure nanotechnology scanning transmission electron microscope temperature transmi |
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This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
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