Scanning Probe Microscopy of Functional Materials

Serves the rapidly developing field of nanoscale characterization of functional materials propertiesCovers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductorsFocuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrationsCombines theoretical aspects with applications ranging from fundamental physical studies to device characterizationIncludes supplementary material: sn.pub/extras

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Scanning Probe Microscopy of Functional Materials Alexei Gruverman, Sergei V. Kalinin

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