Soft Error Mechanisms, Modeling and Mitigation
Autor: | Sayil, Selahattin |
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EAN: | 9783319306063 |
Auflage: | 001 |
Sachgruppe: | Technik |
Sprache: | Englisch |
Seitenzahl: | 120 |
Produktart: | Gebunden |
Veröffentlichungsdatum: | 04.03.2016 |
Schlagworte: | Elektrotechnik |
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Introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced jitter and race, single event coupling noise, delay and speed-up effects and then compares coupling induced noise and delay effects to single event transients and soft delaysPresents closed form expressions for single event crosstalk noise, delay and speed-up effectsIncludes a reliability analysis of low power energy-efficient designs so that reader can make clever design choices that reduce static power consumption and improve soft error reliability