Transmission Electron Microscopy and Diffractometry of Materials
| Autor: | Fultz, Brent Howe, James |
|---|---|
| EAN: | 9783642433153 |
| Auflage: | 004 |
| Sachgruppe: | Chemie |
| Sprache: | Englisch |
| Seitenzahl: | 784 |
| Produktart: | Kartoniert / Broschiert |
| Veröffentlichungsdatum: | 09.11.2014 |
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New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching with numerous problems at the end of each chapter to give students practice with the concepts and practical applications Explains the mathematics needed consistently through the book Helps to extend knowledge by indicating further reading Explains concepts in detail, with no requirement for different reference materials Includes supplementary material: sn.pub/extras
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