CMOS Test and Evaluation
Autor: | Bhushan, Manjul Ketchen, Mark B. |
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EAN: | 9781493913480 |
Sachgruppe: | Technik |
Sprache: | Englisch |
Seitenzahl: | 440 |
Produktart: | Gebunden |
Veröffentlichungsdatum: | 04.12.2014 |
Untertitel: | A Physical Perspective |
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Relates CMOS product performance to basic physical models of transistors and passive elementsUses embedded test structures and sensors for product test debug, yield and performance evaluationDescribes impact of device variabilityDiscusses application corners, schmooing and product specifications including guardbandsPresents an overall view of CMOS product chip test, test equipment and diagnostic toolsDescribes data analysis techniques for rapid evaluation and debug during testFeatures nearly 300 illustrationsIncludes supplementary material: sn.pub/extrasRequest lecturer material: sn.pub/lecturer-material