CMOS Test and Evaluation
Autor: | Bhushan, Manjul Ketchen, Mark B. |
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EAN: | 9781493947027 |
Sachgruppe: | Technik |
Sprache: | Englisch |
Seitenzahl: | 440 |
Produktart: | Kartoniert / Broschiert |
Veröffentlichungsdatum: | 10.09.2016 |
Untertitel: | A Physical Perspective |
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Relates CMOS product performance to basic physical models of transistors and passive elements Uses embedded test structures and sensors for product test debug, yield and performance evaluation Describes impact of device variability Discusses application corners, schmooing and product specifications including guardbands Presents an overall view of CMOS product chip test, test equipment and diagnostic tools Describes data analysis techniques for rapid evaluation and debug during test Features nearly 300 illustrations Includes supplementary material: sn.pub/extras Request lecturer material: sn.pub/lecturer-material