Design, Analysis and Test of Logic Circuits Under Uncertainty
| Autor: | Smita Krishnaswamy, Igor L. Markov, John P. Hayes |
|---|---|
| EAN: | 9789048196449 |
| eBook Format: | |
| Sprache: | Englisch |
| Produktart: | eBook |
| Veröffentlichungsdatum: | 21.09.2012 |
| Kategorie: | |
| Schlagworte: | Fault-tolerance Probabilistic logic Reliability Soft errors Uncertainty |
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Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
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