Modeling Nanoscale Imaging in Electron Microscopy
| Autor: | Thomas Vogt, Wolfgang Dahmen, Peter Binev |
|---|---|
| EAN: | 9781461421917 |
| eBook Format: | |
| Sprache: | Englisch |
| Produktart: | eBook |
| Veröffentlichungsdatum: | 02.03.2012 |
| Kategorie: | |
| Schlagworte: | Analysis Dahmen Electron Imaging Microscopy Modeling Nanoscale Resolution STEM TEM Vogt |
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Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Thomas Vogt is Director of the NanoCenter Educational Foundation and Distinguished Professor of Chemistry & Biochemistry at the University of South Carolina.
Wolfgang Dahmen is a professor at RWTH Aachen.
Peter G. Binev is a Professor of Mathematics at the University of South Carolina.
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