Strain Effect in Semiconductors
Autor: | Nishida, Toshikazu Sun, Yongke Thompson, Scott E |
---|---|
EAN: | 9781441905512 |
Auflage: | 2010 |
Sachgruppe: | Technik |
Sprache: | Englisch |
Seitenzahl: | 350 |
Produktart: | Gebunden |
Veröffentlichungsdatum: | 04.12.2009 |
Untertitel: | Theory and Device Applications |
Schlagworte: | Technology & Industrial Arts |
173,50 €*
Die Verfügbarkeit wird nach ihrer Bestellung bei uns geprüft.
Bücher sind in der Regel innerhalb von 1-2 Werktagen abholbereit.
Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. The book discusses relevant applications of strain while also focusing on the fundamental physics as they pertain to bulk, planar, and scaled nano-devices. Lead authors Yongke Sun, Scott Thompson and Toshikazu Nishida also: Treat strain physics at both the qualitative overview level as well as provide detailed fundamentals Explain strain physics relevant to logic devices as well as strain-based MEMS This book is relevant to current strained Si logic technology, as well as for understanding the physics and scaling of future strain nano-scale devices. It is perfect for practicing device engineers at semiconductor manufacturers, as well as graduate students studying device physics at universities.