Temperature Measurement during Millisecond Annealing

Denise Reichel studies the delicate subject of temperature measurement during lamp-based annealing of semiconductors, in particular during flash lamp annealing. The approach of background-correction using amplitude-modulated light to obtain the sample reflectivity is reinvented from rapid thermal annealing to apply to millisecond annealing. The author presents a new method independent of the lamp operation to obtain this amplitude modulation and derives a formula to describe the process. Further, she investigates the variables of the formula in depth to validate the method¿s suitability for background-corrected temperature measurement. The experimental results finally proof its power for elevated temperatures.

Verwandte Artikel

Download
PDF

Weitere Produkte vom selben Autor

Flash Lamp Annealing Rebohle, Lars, Reichel, Denise, Prucnal, Slawomir

139,09 €*
Flash Lamp Annealing Rebohle, Lars, Reichel, Denise, Prucnal, Slawomir

139,09 €*