Test and Diagnosis for Small-Delay Defects

Tehranipoor, Mohammad, Chakrabarty, Krishnendu, Peng, Ke

Autor:	Chakrabarty, Krishnendu Peng, Ke Tehranipoor, Mohammad
EAN:	9781441982964
Sachgruppe:	Technik
Sprache:	Englisch
Seitenzahl:	232
Produktart:	Gebunden
Veröffentlichungsdatum:	27.09.2011
Schlagworte:	Elektronik - Elektroniker

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Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defectsPresents the most effective techniques for screening small-delay defects, such as long path-based, slack-based, critical fault-based, and noise-aware methodologiesShows readers to use timing information for small-delay defect diagnosis, in order to increase the resolution of their current diagnosis flowIncludes supplementary material: sn.pub/extras

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Test and Diagnosis for Small-Delay Defects Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty

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Test and Diagnosis for Small-Delay Defects Tehranipoor, Mohammad, Chakrabarty, Krishnendu, Peng, Ke

119,99 €*

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